Dr. Changyuan Chen
Sr Device Engineer at Silicon Storage Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 17, 2005
Proc. SPIE. 5755, Data Analysis and Modeling for Process Control II
KEYWORDS: Data modeling, Calibration, Measurement devices, Transistors, Computer aided design, System on a chip, Process modeling, Device simulation, Solid modeling, Instrument modeling

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