Chao-Fang Li
Chief at TrueLight Corp
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 16 June 2004
Proc. SPIE. 5364, Vertical-Cavity Surface-Emitting Lasers VIII
KEYWORDS: Vertical cavity surface emitting lasers, Manufacturing, Semiconducting wafers, Reliability, Process control, Oxides, Control systems, Indium gallium arsenide, Temperature metrology, Oxidation

Proceedings Article | 12 May 2004
Proc. SPIE. 5280, Materials, Active Devices, and Optical Amplifiers
KEYWORDS: Vertical cavity surface emitting lasers, Quantum wells, Oxides, Lithium, Semiconducting wafers, Gallium arsenide, Continuous wave operation, Fiber optic communications, Active optics, Oxidation

Proceedings Article | 17 June 2003
Proc. SPIE. 4994, Vertical-Cavity Surface-Emitting Lasers VII
KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Picosecond phenomena, Semiconducting wafers, Manufacturing, Failure analysis, Data communications, Packaging, Transmission electron microscopy, Oxidation

Proceedings Article | 19 October 2001
Proc. SPIE. 4580, Optoelectronics, Materials, and Devices for Communications
KEYWORDS: Vertical cavity surface emitting lasers, Data communications, Reliability, Semiconducting wafers, Oxides, Data transmission, Modulation, Phase only filters, Manufacturing, Multimode fibers

Proceedings Article | 4 May 2001
Proc. SPIE. 4286, Vertical-Cavity Surface-Emitting Lasers V
KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Reliability, Data communications, Manufacturing, Phase only filters, Data transmission, Transceivers, Resistance, Multimode fibers

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