Chao Bi
at CPEI
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 18 December 2019
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Sensors, Mathematical modeling, Inspection, Reliability, Laser applications, Reflection, Semiconductor lasers, Aerospace engineering, Target detection, Manufacturing

Proceedings Article | 24 October 2017
Proc. SPIE. 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing
KEYWORDS: Sensors, Precision measurement, Optical filters, Spatial filters

Proceedings Article | 24 October 2017
Proc. SPIE. 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing
KEYWORDS: Optical scanning systems, Optical scanning, Sensors

Proceedings Article | 19 October 2016
Proc. SPIE. 10155, Optical Measurement Technology and Instrumentation
KEYWORDS: Colorimetry, Confocal microscopy, Sensors, Precision measurement

Proceedings Article | 19 October 2016
Proc. SPIE. 10155, Optical Measurement Technology and Instrumentation
KEYWORDS: Image filtering, Optical filters, Digital filtering, Color vision, Digital imaging

Showing 5 of 7 publications
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