Chaowei Zhuang
at Tsinghua Univ.
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Near infrared, Safety, Statistical analysis, Calibration, Chemical analysis, Instrument modeling

Proceedings Article | 8 March 2017
Proc. SPIE. 10255, Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016
KEYWORDS: Near infrared, Spectrum analysis, Wavelet transforms, Fluctuations and noise, Data modeling, Spectroscopy, Reflectivity, Chromatography, Spectral data processing, Bandpass filters

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