Dr. Charles L. Adler
Assistant Professor at St Marys College of Maryland
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 20, 2002
Proc. SPIE. 4777, Interferometry XI: Techniques and Analysis
KEYWORDS: Moire patterns, Metrology, Data modeling, Reflection, Scattering, Cameras, Light scattering, Coating, Refraction, Liquids

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