Dr. Charles Joenathan
Professor/Chair at Rose-Hulman Institute of Technology
SPIE Involvement:
Fellow status | Conference Program Committee | Symposium Committee | Journal Editorial Board Member | Author
Publications (32)

Proceedings Article | 14 September 2018
Proc. SPIE. 10741, Optics Education and Outreach V
KEYWORDS: Reflectors, Light emitting diodes, LED lighting, Video, Solar cells, Light sources and illumination, Optical engineering, Nonimaging optics, Prototyping, Light

Proceedings Article | 15 June 2018
Proc. SPIE. 10692, Optical Fabrication, Testing, and Metrology VI
KEYWORDS: Mirrors, Beam splitters, Phase shifting, Polarization, Interferometers, Interferometry, Wave plates, CCD cameras, Visibility, Phase shifts

Proceedings Article | 28 August 2016
Proc. SPIE. 9960, Interferometry XVIII
KEYWORDS: Monochromatic aberrations, Mirrors, Beam splitters, Metrology, Interferometers, Interferometry, Wavefront sensors, Wavefronts, Quality measurement, Michelson interferometers

SPIE Journal Paper | 15 February 2016
OE Vol. 55 Issue 02
KEYWORDS: Mirrors, Interferometers, Michelson interferometers, Beam splitters, Ferroelectric materials, Reflection, Modulation, Sensors, Optical engineering, Interferometry

Proceedings Article | 8 October 2015
Proc. SPIE. 9793, Education and Training in Optics and Photonics: ETOP 2015
KEYWORDS: Photonic devices, Optical design, Physics, Telecommunications, Optical tracking, Mathematics, Optical engineering, Scanning laser ophthalmoscopy, Geometrical optics, Communication engineering

Showing 5 of 32 publications
Conference Committee Involvement (6)
Two- and Three-Dimensional Methods for Inspection and Metrology V
12 September 2007 | Boston, MA, United States
Two- and Three-Dimensional Methods for Inspection and Metrology IV
1 October 2006 | Boston, Massachusetts, United States
Optics East 2006
1 October 2006 | Boston, United States
Interferometry XIII: Techniques and Analysis
14 August 2006 | San Diego, California, United States
Two- and Three-Dimensional Methods for Inspection and Metrology III
25 October 2005 | Boston, MA, United States
Showing 5 of 6 Conference Committees
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