Mr. Chayan Mitra
Manager at GE India Technology Centre Pvt Ltd
SPIE Involvement:
Author
Area of Expertise:
Tunable Diode Laser Absorption Spectroscopy , Camera based sensors , Optical sensors for harsh environment , Sensors , Mid-IR absorption spectroscopy
Websites:
Profile Summary

Manage a team working on harsh environment and emissions sensing.
Principal Investigator and Program leader for:
Laser based sensing for energy applications, Harsh environment sensor, tunable diode laser absorption spectroscopy, Mid-IR Absorption Spectroscopy, Sensors and monitoring devices for Energy and Oil & Gas applications.

I'm certified Six Sigma Black Belt.

11 granted US patents (US6849798B2; US7181972B2; US7187021B2; US7345280B2; US7381954B2, US8424292B2, US8602722B2, US8587660B2, US8702302B2, US8711340B2, US9091206B2)
Several US patent applications pending.

SPIE Proferssional: Opto-Diagnostics for Power Plants (http://spie.org/x48942.xml)
Publications (6)

SPIE Journal Paper | October 6, 2016
OE Vol. 55 Issue 10
KEYWORDS: Raman spectroscopy, Gases, Calibration, Spectroscopy, Carbon monoxide, Raman scattering, Mirrors, Optical engineering, Signal analysis, Methane

SPIE Journal Paper | March 14, 2016
OE Vol. 55 Issue 03
KEYWORDS: Semiconductor lasers, Diodes, Methane, Modulation, Absorption, Absorbance, Sensors, Gases, Hydrogen, Optical engineering

PROCEEDINGS ARTICLE | May 13, 2015
Proc. SPIE. 9491, Sensors for Extreme Harsh Environments II
KEYWORDS: Optical sensors, Modulation, Sensors, Spectroscopy, Photodiodes, Receivers, Control systems, Laser spectroscopy, Environmental sensing, Absorption

SPIE Journal Paper | July 1, 2011
MGSP Vol. 6 Issue 03

PROCEEDINGS ARTICLE | September 2, 2010
Proc. SPIE. 7792, Reflection, Scattering, and Diffraction from Surfaces II
KEYWORDS: Polishing, Metals, Reflectivity, Surface roughness, Photodiodes, Speckle pattern, Specular reflections, Aluminum, Surface finishing, Temperature metrology

PROCEEDINGS ARTICLE | May 14, 2010
Proc. SPIE. 7726, Optical Sensing and Detection
KEYWORDS: Metals, Electrons, Reflectivity, Combustion, Surface properties, Aluminum, Phonons, Environmental sensing, Temperature metrology, Plasma

Showing 5 of 6 publications
Conference Committee Involvement (1)
IEEE ECCE
17 September 2011 |
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