Dr. Chen-Yu Wang
at Industrial Technology Research Institute
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 August 2005
Proc. SPIE. 5879, Recent Developments in Traceable Dimensional Measurements III
KEYWORDS: Nanotechnology, Statistical analysis, Optical spheres, Calibration, Nanoparticles, Particles, Atomic force microscopy, Transmission electron microscopy, Dynamic light scattering, Standards development

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