Chen Hailin
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 November 2007
Proc. SPIE. 6788, MIPPR 2007: Pattern Recognition and Computer Vision
KEYWORDS: Detection and tracking algorithms, Data storage, Image segmentation, Pattern recognition, Error analysis, Computer vision technology, Machine vision, Picosecond phenomena, Data centers, Neodymium

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