Chenfa Li
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 December 2009 Paper
Meiling Yuan, Chenfa Li, Xinli Leng, Qingnian Wang
Proceedings Volume 7631, 76312G (2009) https://doi.org/10.1117/12.851422
KEYWORDS: Neodymium, Silicon, Luminescence, Ions, Annealing, Thin films, Temperature metrology, Ultraviolet radiation, Ion implantation, Silicon films

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