Ms. Chen-Wei Lee Profile

Chen-Wei Lee

Graduate Student at National Sun Yat-Sen Univ

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Publications (5)

Proceedings Article | 15 October 2012 Paper

Speckle reduction for fringe patterns using a database system based on the empirical mode decomposition

Wei-Hung Su, Chen-Wei Lee, Chao-Kuei Lee

Proceedings Volume 8497, 84970M (2012) https://doi.org/10.1117/12.930603

KEYWORDS: Speckle, Fringe analysis, Databases, Signal to noise ratio, Speckle pattern, Interference (communication), Sun, Optimization (mathematics), Fourier transforms, Wavelets

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Proceedings Article | 8 September 2011 Paper

Speckle-reduction for fringe patterns using the 1D empirical mode decomposition

Wei-Hung Su, Chao-Kuei Lee, Cheng-Wei Lee

Proceedings Volume 8120, 812012 (2011) https://doi.org/10.1117/12.892733

KEYWORDS: Speckle, Fringe analysis, Databases, Signal generators, Speckle pattern, CCD cameras, Signal to noise ratio, Light sources, Pixel resolution, Michelson interferometers

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Proceedings Article | 18 August 2010 Paper

A database system using the empirical mode decomposition to smooth subjective speckles in fringe patterns

Wei-Hung Su, Chao-Kuei Lee, Cheng-Wei Lee

Proceedings Volume 7781, 77810P (2010) https://doi.org/10.1117/12.859767

KEYWORDS: Databases, Fringe analysis, Signal generators, Speckle, Computer simulations, Signal to noise ratio, Phase shifts, Image filtering, Light sources, Inspection

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Proceedings Article | 8 February 2010 Paper

Noise-reduction in fringe patterns based on the empirical mode decomposition

Wei-Hung Su, Chao-Kuei Lee, Chen-Wei Lee

Proceedings Volume 7613, 76130V (2010) https://doi.org/10.1117/12.841515

KEYWORDS: Signal to noise ratio, Fringe analysis, Interference (communication), Image processing, Statistical analysis, Interferometry, Denoising, Computer simulations, Inspection, Electronic filtering

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Proceedings Article | 25 August 2008 Paper

Speckles removal from interference patterns illuminated by coherent light using empirical mode decomposition

Wei-Hung Su, Chao-Kuei Lee, Cheng-Wei Lee

Proceedings Volume 7056, 70561Q (2008) https://doi.org/10.1117/12.796697

KEYWORDS: Speckle, Fringe analysis, Signal to noise ratio, Light sources, Phase shifts, Interference (communication), Data modeling, Signal processing, Optical metrology, Optical microscopy

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