Dr. Cheng-Yang Liu
Researcher at Industrial Technology Research Institute
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 17 June 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Nanoparticles, Light scattering, Scattering, Polarization, Semiconducting wafers, Particles, Silicon, Picosecond phenomena, Gold, Scatter measurement

Proceedings Article | 17 June 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Wavelength division multiplexing, Waveguides, Finite-difference time-domain method, Photonic crystals, Silicon, Multiplexing, Wave propagation, Dielectrics, Fabrication, Electron beam lithography

Proceedings Article | 11 August 2008
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Computer programming, Heterodyning, Signal detection, Laser optics, Sensors, Interferometry, Beam splitters, Optics manufacturing, Scanning probe microscopy, Diffraction gratings

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top