Cheng-jun Xie
at Beihua Univ
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 14 December 2015
Proc. SPIE. 9815, MIPPR 2015: Remote Sensing Image Processing, Geographic Information Systems, and Other Applications
KEYWORDS: Safety, Data hiding, Medical imaging, Image quality, Binary data, Standards development, Steganography, Image quality standards, RGB color model, Francium

Proceedings Article | 19 December 2013
Proc. SPIE. 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
KEYWORDS: Medicine, Data hiding, Image processing, Wavelets, Image restoration, Image quality, Image transmission, Information technology, Binary data, Information security

Proceedings Article | 19 December 2013
Proc. SPIE. 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
KEYWORDS: MODIS, Calibration, Image processing, Remote sensing, Reflectivity, Clouds, Image quality, Image sensors, Data processing, Snow cover

Proceedings Article | 30 October 2009
Proc. SPIE. 7498, MIPPR 2009: Remote Sensing and GIS Data Processing and Other Applications
KEYWORDS: Lithium, Medicine, Image compression, Visualization, Data hiding, Remote sensing, Image quality, Bismuth, Relativity, Image quality standards

Proceedings Article | 30 October 2009
Proc. SPIE. 7494, MIPPR 2009: Multispectral Image Acquisition and Processing
KEYWORDS: Hyperspectral imaging, Wavelet transforms, Image compression, Digital image processing, Image processing, Wavelets, Computer programming, Discrete wavelet transforms, Binary data, Algorithms

Proceedings Article | 28 January 2009
Proc. SPIE. 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
KEYWORDS: Lithium, Image encryption, Wavelet transforms, Image compression, Digital image processing, Modulation, Image processing, Image restoration, Digital watermarking, Binary data

Showing 5 of 11 publications
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