Cheng Chen
at Xinjiang Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Detection and tracking algorithms, Data modeling, Pattern recognition, Spectroscopy, Feature extraction, Pollution, UV-Vis spectroscopy, Water contamination, Statistical modeling, Quality testing methods

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Nanoparticles, Metals, Water, Silicon, Surface enhanced Raman spectroscopy, Raman spectroscopy, Pollution, Raman scattering, Chemical elements, Arsenic

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