In order to improve the accuracy of geometrical defect detection, this paper presented a method based on HU
moment invariants of skeleton image. This method have four steps: first of all, grayscale images of non-silicon MEMS
parts are collected and converted into binary images, secondly, skeletons of binary images are extracted using medialaxis-
transform method, and then HU moment invariants of skeleton images are calculated, finally, differences of HU
moment invariants between measured parts and qualified parts are obtained to determine whether there are geometrical
defects. To demonstrate the availability of this method, experiments were carried out between skeleton images and
grayscale images, and results show that: when defects of non-silicon MEMS part are the same, HU moment invariants of
skeleton images are more sensitive than that of grayscale images, and detection accuracy is higher. Therefore, this
method can more accurately determine whether non-silicon MEMS parts qualified or not, and can be applied to nonsilicon
MEMS part detection system.
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