Mr. Chi Ho Hwang
at KAIST
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | May 4, 2010
Proc. SPIE. 7660, Infrared Technology and Applications XXXVI
KEYWORDS: Amorphous silicon, Bolometers, Microbolometers, Oxides, Thin films, Metals, Nickel, Resistance, Oxygen, Electrical engineering

PROCEEDINGS ARTICLE | May 1, 2008
Proc. SPIE. 6940, Infrared Technology and Applications XXXIV
KEYWORDS: Readout integrated circuits, Microbolometers, Signal to noise ratio, Capacitors, Interference (communication), Amplifiers, Capacitance, CMOS technology, Analog electronics, Negative feedback

PROCEEDINGS ARTICLE | April 16, 2008
Proc. SPIE. 6940, Infrared Technology and Applications XXXIV
KEYWORDS: Infrared detectors, Thermography, Capacitors, Silica, Sensors, Electrodes, Capacitance, Infrared radiation, Aluminum, Temperature metrology

PROCEEDINGS ARTICLE | May 14, 2007
Proc. SPIE. 6542, Infrared Technology and Applications XXXIII
KEYWORDS: Readout integrated circuits, Microbolometers, Digital signal processing, Capacitors, Amplifiers, Capacitance, Signal processing, CMOS technology, Digital electronics, Device simulation

PROCEEDINGS ARTICLE | May 14, 2007
Proc. SPIE. 6542, Infrared Technology and Applications XXXIII
KEYWORDS: Signal to noise ratio, Infrared imaging, Capacitors, Sensors, Satellites, Clouds, Satellite imaging, Capacitance, Infrared radiation, Adaptive control

PROCEEDINGS ARTICLE | May 14, 2007
Proc. SPIE. 6542, Infrared Technology and Applications XXXIII
KEYWORDS: Infrared detectors, Thermography, Capacitors, Sensors, Electrodes, Capacitance, Thermal effects, Infrared radiation, Aluminum, Temperature metrology

Showing 5 of 7 publications
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