Chia-Hao Wu
at Yuan Ze Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 9, 2006
Proc. SPIE. 6070, Machine Vision Applications in Industrial Inspection XIV
KEYWORDS: Imaging systems, Metals, Image processing, X-rays, Inspection, Image analysis, Optical inspection, Image quality, X-ray imaging, Tolerancing

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