A mask optimization algorithm is presented for the scanning projected fringe profilometry. It uses a sinusoidal pattern to illuminate the inspected object. Fringes on the inspected objects are recorded by the image sensor array. The mask optimization algorithm helps to identify the amplitude of the projected fringes. With the mask optimization, to analyze surfaces with low reflectance is possible.
A scanning fringe projection technique is presented to retrieve the 3D shape of an object with large depth discontinuities. A 1D sinusoidal pattern is employed as the projected pattern. With a reliable image processing algorithm, noises and errors are efficiently detected and reduced.