Dr. Chih-Shang Liu
at Industrial Technology Research Institute
SPIE Involvement:
Publications (4)

PROCEEDINGS ARTICLE | September 26, 2016
Proc. SPIE. 9961, Reflection, Scattering, and Diffraction from Surfaces V
KEYWORDS: Oxides, Thin films, Microscopes, Reflection, Silicon, Inspection, Reflectivity, Scanning electron microscopy, Reflectometry, Critical dimension metrology

PROCEEDINGS ARTICLE | September 10, 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Hyperspectral imaging, Refractive index, Spectrographs, Data modeling, Polarization, Imaging systems, Polarizers, LCDs, Collimation, Liquid crystals

PROCEEDINGS ARTICLE | September 15, 2005
Proc. SPIE. 5907, Photonic Devices and Algorithms for Computing VII
KEYWORDS: Fiber amplifiers, Mirrors, Optical amplifiers, Clocks, Modulation, Mode locking, Modulators, Fiber lasers, Nonlinear optics, Optical clocks

PROCEEDINGS ARTICLE | February 6, 2004
Proc. SPIE. 5210, Ultrahigh- and High-Speed Photography, Photonics, and Videography
KEYWORDS: Optical amplifiers, Modulation, Polarization, Mode locking, Modulators, Fiber lasers, Frequency modulation, High speed photography, Optical isolators, Amplitude modulation

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