Chih-Yung Cheng
at Industrial Technology Research Institute
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 November 2002 Paper
Hung-Yin Tsai, Chih-Yung Cheng, Pin-Yin Liu, Tung-Chuan Wu
Proceedings Volume 4936, (2002) https://doi.org/10.1117/12.469742
KEYWORDS: Diamond, Chemical vapor deposition, Surface roughness, Semiconducting wafers, Image processing, Atomic force microscopy, Diamond machining, Raman spectroscopy, Polishing, Spindles

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top