Prof. Ching-Chung Yin
at National Chiao Tung Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 16, 2011
Proc. SPIE. 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Fringe analysis, Defect detection, Speckle, Solar cells, Crystals, Silicon, Inspection, Electroluminescence, Speckle pattern, Silicon solar cells

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top