Dr. Chinlee Wang
President at X-Scan Imaging Corp
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 4, 1998
Proc. SPIE. 3506, Microelectronic Device Technology II
KEYWORDS: Semiconductors, Oxides, Metals, Silicon, Platinum, Transmission electron microscopy, Time metrology, Field effect transistors, Picosecond phenomena, Temperature metrology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top