Dr. Chris G. Lowrie
Senior Engineer
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 13 February 2008
Proc. SPIE. 6898, Silicon Photonics III
KEYWORDS: Thin films, Sensors, Silicon, Hydrogen, Light scattering, Reflectivity, Atomic force microscopy, Silicon films, Palladium, Semiconducting wafers

Proceedings Article | 13 February 2008
Proc. SPIE. 6898, Silicon Photonics III
KEYWORDS: Holography, Scattering, Image segmentation, Silicon, Light scattering, Reflectivity, Computer simulations, Image filtering, Atomic force microscope, Scanning probe microscopy

Proceedings Article | 17 April 2006
Proc. SPIE. 6247, Independent Component Analyses, Wavelets, Unsupervised Smart Sensors, and Neural Networks IV
KEYWORDS: Independent component analysis, Sensors, Wavelets, Feature extraction, Signal processing, Neural networks, Signal analyzers, Acoustics, Vector spaces, Neurons

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