Chris O. Muller
Technical Director at Purafil Inc
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 19, 2007
Proc. SPIE. 6463, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI
KEYWORDS: Environmental monitoring, Sensors, Metals, Crystals, Copper, Corrosion, Control systems, Process control, Acoustics, Environmental sensing

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