Chris O. Muller
Technical Director at Purafil Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 January 2007 Paper
Proc. SPIE. 6463, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI
KEYWORDS: Corrosion, Sensors, Metals, Crystals, Environmental monitoring, Acoustics, Process control, Control systems, Environmental sensing, Copper

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