Christian Dahmen
at Carl von Ossietzky Univ Oldenburg
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | November 15, 2011
Proc. SPIE. 8335, 2012 International Workshop on Image Processing and Optical Engineering
KEYWORDS: Detection and tracking algorithms, Sensors, Image processing, Robotics, Electron microscopes, Control systems, Scanning electron microscopy, Image sensors, Object recognition, Nanorobotics

PROCEEDINGS ARTICLE | November 17, 2008
Proc. SPIE. 7266, Optomechatronic Technologies 2008
KEYWORDS: Electron beams, Detection and tracking algorithms, Cameras, Calibration, Image segmentation, Image processing, Electron microscopes, Scanning electron microscopy, Distance measurement, Nanomanipulation

PROCEEDINGS ARTICLE | November 17, 2008
Proc. SPIE. 7266, Optomechatronic Technologies 2008
KEYWORDS: Actuators, Detection and tracking algorithms, Visualization, Imaging systems, Cameras, Sensors, Image processing, Computer programming, Scanning electron microscopy, Prototyping

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