Prof. Christian Faber
at Hochschule für Angewandte Wissenschaften
SPIE Involvement:
Author
Area of Expertise:
Optical Metrology , Sensor Technology , Image Processing , Automated Optical Inspection (AOI) , Phase Measuring Deflectometry (PMD) , Industrial Statistics
Publications (3)

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Mirrors, Eye, Optical spheres, Cameras, Calibration, Glasses, Manufacturing, Interferometry, Deflectometry, Aspheric lenses

PROCEEDINGS ARTICLE | September 13, 2012
Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis
KEYWORDS: Point spread functions, Mirrors, Light sources, Reflection, Spatial frequencies, Calibration, Interferometry, Computer programming, Deflectometry, Signal processing

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Signal to noise ratio, Microscopes, Fringe analysis, Speckle, Sensors, Microscopy, Inspection, Data acquisition, 3D metrology, Objectives

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