Prof. Christian Hafner
Lecturer at ETH Zurich
SPIE Involvement:
Conference Program Committee | Author
Publications (19)

PROCEEDINGS ARTICLE | November 20, 2012
Proc. SPIE. 8564, Nanophotonics and Micro/Nano Optics
KEYWORDS: Gold, Superposition, Plasmonics, Plasmonic waveguides, Waveguides, Silver, Numerical analysis, Wave propagation, Electromagnetism, Electroluminescent displays

PROCEEDINGS ARTICLE | September 21, 2011
Proc. SPIE. 8096, Plasmonics: Metallic Nanostructures and Their Optical Properties IX
KEYWORDS: Plasmonics, Multilayers, Optical spheres, Waveguides, Dielectrics, Silver, Numerical analysis, Wave propagation, Electromagnetism, Dielectric polarization

PROCEEDINGS ARTICLE | May 23, 2011
Proc. SPIE. 8083, Modeling Aspects in Optical Metrology III
KEYWORDS: Multilayers, Optical spheres, Waveguides, Dielectrics, Silver, Magnetism, Free space, Wave propagation, Electromagnetism, Dielectric polarization

PROCEEDINGS ARTICLE | October 12, 2010
Proc. SPIE. 7838, Optics and Photonics for Counterterrorism and Crime Fighting VI and Optical Materials in Defence Systems Technology VII
KEYWORDS: Gold, Plasmonics, Nanostructures, Stars, Optical properties, Scattering, Nanoparticles, Metals, Near field, Near field optics

PROCEEDINGS ARTICLE | June 3, 2010
Proc. SPIE. 7729, Scanning Microscopy 2010
KEYWORDS: Signal to noise ratio, Optical fibers, Microscopes, Waveguides, Visualization, Cladding, Copper, Dielectrics, Near field scanning optical microscopy, Microwave radiation

PROCEEDINGS ARTICLE | May 14, 2010
Proc. SPIE. 7717, Optical Modelling and Design
KEYWORDS: Gold, Plasmonics, Nanostructures, Silica, Nanoparticles, Metals, Matrices, Particles, Numerical simulations, Near field

Showing 5 of 19 publications
Conference Committee Involvement (6)
Modeling Aspects in Optical Metrology
26 June 2017 | Munich, Germany
Modeling Aspects in Optical Metrology V
23 June 2015 | Munich, Germany
Modeling Aspects in Optical Metrology IV
13 May 2013 | Munich, Germany
Modeling Aspects in Optical Metrology
23 May 2011 | Munich, Germany
Modeling Aspects in Optical Metrology
15 June 2009 | Munich, Germany
Showing 5 of 6 published special sections
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