Dr. Christian Hoffmann
at Institut NÉEL
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | September 27, 2012
Proc. SPIE. 8452, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI
KEYWORDS: Bolometers, Telescopes, Astronomy, Resonators, Cameras, Sensors, Superconductors, Multiplexing, Space telescopes, Inductance

PROCEEDINGS ARTICLE | September 24, 2012
Proc. SPIE. 8452, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI
KEYWORDS: Resonators, Waveguides, Sensors, Etching, Metals, Spectroscopy, Silicon, Fourier transforms, Antennas, Inductance

PROCEEDINGS ARTICLE | July 18, 2008
Proc. SPIE. 7020, Millimeter and Submillimeter Detectors and Instrumentation for Astronomy IV
KEYWORDS: Bolometers, Telescopes, Optical filters, Mirrors, Electronics, Cameras, Sensors, Multiplexing, Antennas, Field effect transistors

PROCEEDINGS ARTICLE | July 18, 2008
Proc. SPIE. 7020, Millimeter and Submillimeter Detectors and Instrumentation for Astronomy IV
KEYWORDS: Bolometers, Sensors, Superconductors, Amplifiers, Multiplexing, Antennas, Microfabrication, Niobium, Cryogenics, Standards development

PROCEEDINGS ARTICLE | May 8, 2003
Proc. SPIE. 5115, Noise and Information in Nanoelectronics, Sensors, and Standards
KEYWORDS: Electrodes, Metals, Copper, Interfaces, Silicon, Diffusion, Resistance, Superconductors, Aluminum, Quasiparticles

PROCEEDINGS ARTICLE | December 24, 2002
Proc. SPIE. 4782, X-Ray Mirrors, Crystals, and Multilayers II
KEYWORDS: Mirrors, Multilayers, X-ray optics, X-rays, X-ray diffraction, Silicon, Reflectivity, Reflectometry, Aluminum, X-ray fluorescence spectroscopy

Showing 5 of 7 publications
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