Dr. Christian Moormann
General Manager at AMO GmbH
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 1 May 2014 Paper
Proc. SPIE. 9135, Laser Sources and Applications II
KEYWORDS: Reflectors, Mirrors, Optical design, Silica, Waveguides, Polarization, Reflectivity, Laser resonators, Laser damage threshold, Absorption

Proceedings Article | 28 March 2014 Paper
Proc. SPIE. 9049, Alternative Lithographic Technologies VI
KEYWORDS: Nanostructures, Refractive index, Etching, Dry etching, Silicon, Surface roughness, Nanoimprint lithography, Photoresist processing, Semiconducting wafers, Positron emission tomography

Proceedings Article | 25 October 2013 Paper
Proc. SPIE. 8896, Electro-Optical and Infrared Systems: Technology and Applications X
KEYWORDS: Gold, Plasmonics, Principal component analysis, Explosives detection, Spectroscopy, Molecules, Surface enhanced Raman spectroscopy, Raman spectroscopy, Chemical analysis, Explosives

Proceedings Article | 15 May 2008 Paper
Proc. SPIE. 6999, Organic Optoelectronics and Photonics III
KEYWORDS: Thin films, Mirrors, Finite-difference time-domain method, Polymers, Photonic crystals, Laser damage threshold, Picosecond phenomena, Laser crystals, Analytical research, Mirror structures

Proceedings Article | 1 May 2008 Paper
Proc. SPIE. 6996, Silicon Photonics and Photonic Integrated Circuits
KEYWORDS: Lithography, Photonic devices, Refractive index, Optical design, Resonators, Waveguides, Etching, Silicon, Modulators, Reactive ion etching

Showing 5 of 6 publications
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