Christian Recknagel
at Helmut-Schmidt Univ
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 17 May 2013
Proc. SPIE. 8763, Smart Sensors, Actuators, and MEMS VI
KEYWORDS: Carbon, Thin films, Spindles, Sensors, Electrodes, Silicon, Coating, Resistance, Chromium, Silicon carbide

Proceedings Article | 22 May 2009
Proc. SPIE. 7378, Scanning Microscopy 2009
KEYWORDS: Image processing algorithms and systems, Metrology, Principal component analysis, Detection and tracking algorithms, Interferometers, Sensors, Image segmentation, Atomic force microscopy, Time metrology, Velocity measurements

Proceedings Article | 25 April 2008
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Mirrors, Metrology, Interferometers, Cameras, Sensors, Calibration, Atomic force microscopy, Data conversion, Binary data, Laser sintering

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