Prof. Christian Rembe
Division Manager at Clausthal Univ of Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (26)

PROCEEDINGS ARTICLE | July 28, 2017
Proc. SPIE. 10411, Clinical and Preclinical Optical Diagnostics

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Mechanics, Interferometers, Interferometry, Phase interferometry, Optical testing, Semiconductor lasers, Solids, 3D metrology, Wavelength tuning, Digital image correlation, 3D image processing, Phase shifts

SPIE Journal Paper | March 26, 2014
OE Vol. 53 Issue 03
KEYWORDS: Microscopes, Light scattering, Vibrometry, Interferometers, Motion measurement, Doppler effect, Microelectromechanical systems, Laser scattering, 3D metrology, Optical testing

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Interferometers, Cameras, Sensors, Demodulation, Optical testing, Head, Heterodyning, Vibrometry, Objectives, Signal detection

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Microelectromechanical systems, Doppler effect, Scattering, Sensors, Optical testing, Heterodyning, Vibrometry, 3D metrology, Motion measurement, Signal detection

PROCEEDINGS ARTICLE | September 13, 2012
Proc. SPIE. 8494, Interferometry XVI: Applications
KEYWORDS: Diffraction, Holograms, Holography, Modulation, Interferometry, Phase shift keying, Modulators, Spatial light modulators, Liquid crystal on silicon, Vibrometry

Showing 5 of 26 publications
Conference Committee Involvement (4)
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Optical Measurement Systems for Industrial Inspection IX
22 June 2015 | Munich, Germany
Interferometry XVII: Advanced Applications
19 August 2014 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection VIII
13 May 2013 | Munich, Germany
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