Prof. Christian Rembe
Division Manager at Clausthal Univ of Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (30)

SPIE Journal Paper | 7 August 2019
OE Vol. 58 Issue 08
KEYWORDS: Microlens, Microlens array, Mirrors, Objectives, Distance measurement, Laser scanners, Scanners, Prisms, Spatial resolution, Optical engineering

Proceedings Article | 11 April 2019
Proc. SPIE. 11028, Optical Sensors 2019
KEYWORDS: Optical components, Mirrors, LIDAR, Sensors, Scanners, Laser scanners, Distance measurement, Objectives, Spatial resolution, 3D scanning

Proceedings Article | 17 September 2018
Proc. SPIE. 10726, Nanoimaging and Nanospectroscopy VI
KEYWORDS: Confocal microscopy, Diffraction, Optical lithography, Super resolution, Modulation, Opacity, Microscopy, Molecules, Dielectrics, Absorbance

Proceedings Article | 18 August 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Laser sources, Microscopes, Photodetectors, Optical filters, Electronics, Semiconductor lasers, Heterodyning, Vibrometry, Laser Doppler velocimetry, Acousto-optics

Proceedings Article | 28 July 2017
Proc. SPIE. 10411, Clinical and Preclinical Optical Diagnostics

Showing 5 of 30 publications
Conference Committee Involvement (7)
Optical Technology and Measurement for Industrial Applications Conference
23 April 2020 | Yokohama, Japan
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Optical Technology and Measurement for Industrial Applications Conference
23 April 2019 | Yokohama, Japan
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Optical Measurement Systems for Industrial Inspection IX
22 June 2015 | Munich, Germany
Showing 5 of 7 Conference Committees
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