Prof. Christian Rembe
Division Manager at Clausthal Univ of Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (30)

SPIE Journal Paper | 7 August 2019
OE Vol. 58 Issue 08
KEYWORDS: Microlens, Microlens array, Mirrors, Objectives, Distance measurement, Laser scanners, Scanners, Prisms, Spatial resolution, Optical engineering

Proceedings Article | 11 April 2019 Presentation + Paper
Proc. SPIE. 11028, Optical Sensors 2019
KEYWORDS: Mirrors, Scanners, Distance measurement, Laser scanners, Objectives, LIDAR, Spatial resolution, 3D scanning, Sensors, Optical components

Proceedings Article | 17 September 2018 Presentation
Proc. SPIE. 10726, Nanoimaging and Nanospectroscopy VI
KEYWORDS: Microscopy, Modulation, Super resolution, Absorbance, Confocal microscopy, Diffraction, Optical lithography, Molecules, Opacity, Dielectrics

Proceedings Article | 18 August 2018 Paper
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Heterodyning, Laser Doppler velocimetry, Photodetectors, Semiconductor lasers, Vibrometry, Microscopes, Electronics, Laser sources, Acousto-optics, Optical filters

Proceedings Article | 28 July 2017 Paper
Proc. SPIE. 10411, Clinical and Preclinical Optical Diagnostics

Showing 5 of 30 publications
Conference Committee Involvement (9)
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Online Only, Germany
Optical Technology and Measurement for Industrial Applications Conference
20 April 2021 | Online, Japan
Optical Technology and Measurement for Industrial Applications Conference
22 April 2020 | Yokohama, Japan
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Optical Technology and Measurement for Industrial Applications Conference
23 April 2019 | Yokohama, Japan
Showing 5 of 9 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top