Dr. Christian Teutsch
Research Engineer at Fraunhofer-IFF
SPIE Involvement:
Author
Area of Expertise:
optical 3d metrology , point cloud processing , industrial image processing
Websites:
Publications (6)

PROCEEDINGS ARTICLE | October 24, 2016
Proc. SPIE. 9997, Target and Background Signatures II
KEYWORDS: Unmanned aerial vehicles, Roads, Cameras, Sensors, Video, Image acquisition, Image registration, Reconnaissance, Scene simulation, Krypton

PROCEEDINGS ARTICLE | June 21, 2011
Proc. SPIE. 8085, Videometrics, Range Imaging, and Applications XI
KEYWORDS: Detection and tracking algorithms, Visualization, Reflection, Image segmentation, Scanners, Inspection, Clouds, Laser scanners, 3D metrology, 3D scanning

PROCEEDINGS ARTICLE | October 12, 2006
Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV
KEYWORDS: 3D acquisition, Imaging systems, Cameras, Calibration, Image processing, Manufacturing, 3D metrology, Stereo vision systems, 3D image processing, Correlation function

PROCEEDINGS ARTICLE | October 12, 2006
Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV
KEYWORDS: 3D acquisition, Sensors, Calibration, Manufacturing, Clouds, 3D modeling, Feature extraction, Data acquisition, 3D metrology, Computer aided design

PROCEEDINGS ARTICLE | February 9, 2006
Proc. SPIE. 6070, Machine Vision Applications in Industrial Inspection XIV
KEYWORDS: Image processing algorithms and systems, Detection and tracking algorithms, Cameras, Sensors, Calibration, Image segmentation, Image processing, Object recognition, Shape analysis, Bacteria

PROCEEDINGS ARTICLE | January 17, 2005
Proc. SPIE. 5665, Videometrics VIII
KEYWORDS: Laser development, Inspection, Clouds, 3D modeling, Laser scanners, 3D metrology, Light sources and illumination, Measurement devices, Optimization (mathematics), Laser optics

Showing 5 of 6 publications
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