Dr. Christian Teutsch
Research Engineer at Fraunhofer-IFF
SPIE Involvement:
Author
Area of Expertise:
optical 3d metrology , point cloud processing , industrial image processing
Websites:
Publications (6)

Proceedings Article | 24 October 2016 Presentation + Paper
Proc. SPIE. 9997, Target and Background Signatures II
KEYWORDS: Unmanned aerial vehicles, Roads, Cameras, Sensors, Video, Image acquisition, Image registration, Reconnaissance, Scene simulation, Krypton

Proceedings Article | 21 June 2011 Paper
Proc. SPIE. 8085, Videometrics, Range Imaging, and Applications XI
KEYWORDS: Detection and tracking algorithms, Visualization, Reflection, Image segmentation, Scanners, Inspection, Clouds, Laser scanners, 3D metrology, 3D scanning

Proceedings Article | 12 October 2006 Paper
Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV
KEYWORDS: 3D acquisition, Imaging systems, Cameras, Calibration, Image processing, Manufacturing, 3D metrology, Stereo vision systems, 3D image processing, Correlation function

Proceedings Article | 12 October 2006 Paper
Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV
KEYWORDS: 3D acquisition, Sensors, Calibration, Manufacturing, Clouds, 3D modeling, Feature extraction, Data acquisition, 3D metrology, Computer aided design

Proceedings Article | 9 February 2006 Paper
Proc. SPIE. 6070, Machine Vision Applications in Industrial Inspection XIV
KEYWORDS: Image processing algorithms and systems, Detection and tracking algorithms, Cameras, Sensors, Calibration, Image segmentation, Image processing, Object recognition, Shape analysis, Bacteria

Showing 5 of 6 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top