Christian Vieider
Managing Director at Ascatron AB
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 4 January 2008 Paper
Frank Niklaus, Christian Vieider, Henrik Jakobsen
Proceedings Volume 6836, 68360D (2008) https://doi.org/10.1117/12.755128
KEYWORDS: Bolometers, Infrared bolometers, Readout integrated circuits, Semiconducting wafers, Infrared radiation, Infrared imaging, Wafer bonding, Staring arrays, Resistance, Silicon

Proceedings Article | 14 May 2007 Paper
Christian Vieider, Stanley Wissmar, Per Ericsson, Urban Halldin, Frank Niklaus, Göran Stemme, Jan-Erik Källhammer, Håkan Pettersson, Dick Eriksson, Henrik Jakobsen, Terje Kvisterøy, John Franks, Jan VanNylen, Hans Vercammen, Annick VanHulsel
Proceedings Volume 6542, 65421L (2007) https://doi.org/10.1117/12.721272
KEYWORDS: Semiconducting wafers, Bolometers, Sensors, Readout integrated circuits, Wafer bonding, Germanium, Cameras, Packaging, Quantum wells, Far infrared

Proceedings Article | 29 September 2006 Paper
Stanley Wissmar, Linda Höglund, Jan Andersson, Christian Vieider, Susan Savage, Per Ericsson
Proceedings Volume 6401, 64010N (2006) https://doi.org/10.1117/12.689874
KEYWORDS: Quantum wells, Doping, Bolometers, Aluminum, Germanium, Silicon, Resistance, Crystals, Signal to noise ratio, Amorphous silicon

Proceedings Article | 21 April 2006 Paper
Jan-Erik Källhammer, Håkan Pettersson, Dick Eriksson, Stéphane Junique, Susan Savage, Christian Vieider, Jan Andersson, John Franks, Jan Van Nylen, Hans Vercammen, Terje Kvisterøy, Frank Niklaus, Göran Stemme
Proceedings Volume 6198, 619809 (2006) https://doi.org/10.1117/12.663152
KEYWORDS: Long wavelength infrared, Sensors, Germanium, Semiconducting wafers, Bolometers, Wafer bonding, Manufacturing, Cameras, Readout integrated circuits, Packaging

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top