Dr. Christine Borel
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 20 September 2007 Paper
Ch. Morawe, Ch. Borel, J.-Ch. Peffen
Proceedings Volume 6705, 670504 (2007) https://doi.org/10.1117/12.734107
KEYWORDS: Multilayers, Argon, Reflectivity, Ions, Solids, Aluminum, Sputter deposition, Data modeling, Deposition processes, X-rays

Proceedings Article | 11 September 2006 Paper
C. Borel, C. Morawe, A. Rommeveaux, C. Huguenot, J.-C. Peffen
Proceedings Volume 6317, 63170I (2006) https://doi.org/10.1117/12.678472
KEYWORDS: Multilayers, Annealing, Ruthenium, Reflectivity, Interfaces, Coating, Solids, Data modeling, X-rays, Metals

Proceedings Article | 29 August 2006 Paper
Ch. Morawe, O. Hignette, P. Cloetens, W. Ludwig, Ch. Borel, P. Bernard, A. Rommeveaux
Proceedings Volume 6317, 63170F (2006) https://doi.org/10.1117/12.679039
KEYWORDS: Mirrors, Diffraction, Multilayers, Reflection, Reflectivity, X-rays, Refraction, Coating, Synchrotrons, X-ray optics

Proceedings Article | 31 August 2005 Paper
Christine Borel, Christian Morawe, Eric Ziegler, Thierry Bigault, Jean-Yves Massonnat, Jean-Christophe Peffen, Emilie Debourg
Proceedings Volume 5918, 591801 (2005) https://doi.org/10.1117/12.613873
KEYWORDS: Reflectivity, Annealing, Multilayers, Heat treatments, Data modeling, Synchrotron radiation, Ruthenium, X-rays, Synchrotrons, Interfaces

Proceedings Article | 3 November 2004 Paper
Proceedings Volume 5537, (2004) https://doi.org/10.1117/12.561399
KEYWORDS: Silicon, X-rays, Reflectivity, Multilayers, Monochromators, Absorption, Interfaces, X-ray diffraction, Sputter deposition, Synchrotron radiation

Showing 5 of 7 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top