Mr. Christof Pruss
Team Leader at Institut fur Technische Optik
SPIE Involvement:
Conference Program Committee | Author
Publications (34)

SPIE Journal Paper | July 20, 2017
OE Vol. 56 Issue 11
KEYWORDS: Aspheric lenses, Interferometry, Head, Process control, Aspheric optics, Freeform optics, Sensors, Telescopes, Glasses, Head-mounted displays

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Monochromatic aberrations, Metrology, Optical spheres, Nano opto mechanical systems, Spatial frequencies, Interferometers, Calibration, Interferometry, Wavefronts, Clouds, Inverse problems, Aspheric lenses, Reconstruction algorithms, Phase measurement, Algorithm development, Systems modeling

SPIE Journal Paper | January 9, 2017
OE Vol. 56 Issue 01
KEYWORDS: Zoom lenses, Monochromatic aberrations, Interferometry, Glasses, Lenses, Wavefronts, Diffractive optical elements, Optical spheres, Wave propagation, Interferometers

SPIE Journal Paper | November 15, 2016
OE Vol. 55 Issue 11
KEYWORDS: Interferometers, Wavefronts, Computer generated holography, Photovoltaics, Error analysis, Optical engineering, Wavefront reconstruction, Sun, Testing and analysis, Interferometry

PROCEEDINGS ARTICLE | August 5, 2015
Proc. SPIE. 9618, 2015 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
KEYWORDS: Optical components, Monochromatic aberrations, Optical spheres, Diffractive optical elements, Calibration, Interferometry, Wavefronts, Inverse problems, Chemical elements, Inverse optics

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9530, Automated Visual Inspection and Machine Vision
KEYWORDS: Holograms, Quantum wells, Diffractive optical elements, Imaging systems, Cameras, Sensors, Calibration, Error analysis, Electrons, Image sensors

Showing 5 of 34 publications
Conference Committee Involvement (4)
Optical Micro- and Nanometrology
25 April 2018 | Strasbourg, France
Optical Micro- and Nanometrology
5 April 2016 | Brussels, Belgium
Optical Micro- and Nanometrology
15 April 2014 | Brussels, Belgium
Optical Micro- and Nanometrology
16 April 2012 | Brussels, Belgium
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