Dr. Christoph Döring
at Technische Univ. Kaiserslautern
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Fabry–Perot interferometers, Etching, Spectroscopy, Reflectivity, Interferometry, Plasma etching, Reflectance spectroscopy, Reactive ion etching, Group III-V semiconductors, Plasma, Anisotropy

PROCEEDINGS ARTICLE | September 24, 2011
Proc. SPIE. 8125, Optomechanics 2011: Innovations and Solutions
KEYWORDS: Microfluidics, Polymethylmethacrylate, Opacity, Silicon, Photography, Wavefronts, Iris, Iris recognition, Fluid dynamics, Liquids

PROCEEDINGS ARTICLE | February 17, 2011
Proc. SPIE. 7953, Novel In-Plane Semiconductor Lasers X
KEYWORDS: Mid-IR, Optical filters, Mirrors, Resonators, Spatial frequencies, Laser applications, Reflectivity, Gallium antimonide, Semiconductor lasers, Near field

PROCEEDINGS ARTICLE | April 14, 2006
Proc. SPIE. 6184, Semiconductor Lasers and Laser Dynamics II
KEYWORDS: Optical filters, Mirrors, Modulation, Spatial filters, Mode locking, Reflectivity, Semiconductor lasers, Laser damage threshold, Picosecond phenomena, Diffraction gratings

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