Prof. Christoph A. Jungemann
at RWTH Aachen Univ
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | August 25, 2017
Proc. SPIE. 10362, Organic Light Emitting Materials and Devices XXI
KEYWORDS: Organic light emitting diodes, Energy transfer, Diffusion, Physics, Doping, Electroluminescence, Excitons, Electron transport, Luminous efficiency, Phosphorescent materials

PROCEEDINGS ARTICLE | June 11, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Data modeling, Calibration, Silicon, Doping, Monte Carlo methods, Solids, Ionization, Transistors, Heterojunctions, Device simulation

PROCEEDINGS ARTICLE | June 11, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Curium, Scattering, Particles, Silicon, Doping, Numerical modeling, Numerical analysis, Monte Carlo methods, Transistors, Spherical lenses

PROCEEDINGS ARTICLE | June 8, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Scattering, Particles, Silicon, Fourier transforms, Monte Carlo methods, Resistors, Spherical lenses, Electron transport, VHF band, Instrument modeling

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Germanium, Electrons, Diffusion, Doping, Computer simulations, Monte Carlo methods, Solids, Molybdenum, Performance modeling, Instrument modeling

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Scattering, Germanium, Resistance, Computer simulations, Monte Carlo methods, Bismuth, Thermal modeling, Device simulation, Instrument modeling, Accuracy assessment

Showing 5 of 7 publications
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