Christoph J. Lindner
at Technische Univ München
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Light sources, Reflection, Cameras, Metals, Image segmentation, Linear filtering, Feature extraction, Optical inspection, Light sources and illumination, Spatial resolution

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