Dr. Christoph Munkelt
at Fraunhofer-IOF
SPIE Involvement:
Author
Publications (13)

Proceedings Article | 12 April 2021 Presentation + Paper
Proc. SPIE. 11732, Dimensional Optical Metrology and Inspection for Practical Applications X
KEYWORDS: Fringe analysis, Sensors, Nondestructive evaluation, 3D modeling, Optical testing, Time metrology, 3D metrology, Projection systems, Reconstruction algorithms, Performance modeling

Proceedings Article | 21 April 2020 Paper
Proc. SPIE. 11397, Dimensional Optical Metrology and Inspection for Practical Applications IX
KEYWORDS: Near infrared, Light sources, Modulation, Cameras, Sensors, Image processing, Field programmable gate arrays, 3D metrology, Projection systems, Freeform optics, 3D image processing

Proceedings Article | 13 May 2019 Paper
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: Near infrared, 3D acquisition, Cameras, Sensors, Calibration, 3D modeling, Sensor networks, 3D metrology, 3D scanning, 3D image processing

Proceedings Article | 15 May 2018 Presentation
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Near infrared, 3D acquisition, Sensors, Sensor networks, 3D metrology, Projection systems, Sensor fusion, Motion analysis, Sensor technology

Proceedings Article | 22 June 2015 Paper
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Visualization, Calibration, Coating, Laser processing, 3D modeling, 3D metrology, 3D scanning, Computer aided design, Solid modeling, Visibility

Showing 5 of 13 publications
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