Dr. Christoph Munkelt
at Fraunhofer-IOF
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 13 May 2019
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: 3D metrology, Sensors, 3D scanning, Cameras, Near infrared, Calibration, 3D modeling, 3D image processing, 3D acquisition, Sensor networks

Proceedings Article | 15 May 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: 3D metrology, Sensor networks, Sensors, 3D acquisition, Sensor technology, Sensor fusion, Projection systems, Near infrared, Motion analysis

Proceedings Article | 22 June 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: 3D scanning, 3D metrology, Coating, Computer aided design, 3D modeling, Solid modeling, Visualization, Laser processing, Visibility, Calibration

SPIE Journal Paper | 3 June 2013
OE Vol. 52 Issue 06
KEYWORDS: Cameras, Projection systems, Error analysis, 3D metrology, Sensors, Clouds, Phase measurement, Raster graphics, Calibration, Optical engineering

Proceedings Article | 30 May 2013
Proc. SPIE. 8790, Optics for Arts, Architecture, and Archaeology IV
KEYWORDS: 3D scanning, 3D modeling, 3D metrology, Sensors, Optical tracking, Field programmable gate arrays, Visualization, Motion estimation, Image registration, Laser scanners

Showing 5 of 11 publications
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