Dr. Christophe Stolz
Researcher at Univ de Bourgogne
SPIE Involvement:
Conference Program Committee | Author
Publications (17)

PROCEEDINGS ARTICLE | May 14, 2017
Proc. SPIE. 10338, Thirteenth International Conference on Quality Control by Artificial Vision 2017
KEYWORDS: Near infrared, Polarization, Cameras, Stereoscopy, Metals, Glasses, Polarizers, Polarimetry, 3D modeling, 3D metrology, Far infrared, Infrared radiation, 3D image processing, Dielectric polarization

PROCEEDINGS ARTICLE | April 29, 2016
Proc. SPIE. 9896, Optics, Photonics and Digital Technologies for Imaging Applications IV
KEYWORDS: Refractive index, Polarization, Reflection, Imaging systems, Cameras, Inspection, Polarizers, Wave plates, Polarimetry, Distortion, 3D modeling, 3D metrology, Light sources and illumination, Machine vision, Dielectric polarization

SPIE Journal Paper | November 25, 2015
JEI Vol. 24 Issue 06
KEYWORDS: Defect detection, Nondestructive evaluation, Thermography, Image segmentation, 3D scanning, Infrared cameras, Data fusion, Composites, Image processing, Aluminum

PROCEEDINGS ARTICLE | April 30, 2015
Proc. SPIE. 9534, Twelfth International Conference on Quality Control by Artificial Vision 2015
KEYWORDS: Oxides, Real time imaging, Polarization, Metals, Tungsten, Polarimetry, 3D modeling, Infrared radiation, Plasma, Liquids

PROCEEDINGS ARTICLE | April 30, 2015
Proc. SPIE. 9534, Twelfth International Conference on Quality Control by Artificial Vision 2015
KEYWORDS: Infrared cameras, Thermography, 3D acquisition, Defect detection, Diffusion, Inspection, Nondestructive evaluation, 3D modeling, Infrared radiation, 3D scanning

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9205, Reflection, Scattering, and Diffraction from Surfaces IV
KEYWORDS: Light sources, Polarization, Reflection, Cameras, Polarizers, Polarimetry, Distortion, Refraction, 3D metrology, Stereolithography

Showing 5 of 17 publications
Conference Committee Involvement (4)
Image Processing: Machine Vision Applications VIII
10 February 2015 | San Francisco, California, United States
Image Processing: Machine Vision Applications VII
3 February 2014 | San Francisco, California, United States
Image Processing: Machine Vision Applications VI
5 February 2013 | Burlingame, California, United States
Image Processing: Machine Vision Applications V
25 January 2012 | Burlingame, California, United States
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