Christophe Vasse
at Thales LAS France SAS
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 7 May 2019
Proc. SPIE. 11002, Infrared Technology and Applications XLV
KEYWORDS: Infrared detectors, Photovoltaics, Sensors, Manufacturing, Reliability, 3D modeling, Acoustics, Thermal efficiency, Cryogenics, Temperature metrology

Proceedings Article | 7 May 2019
Proc. SPIE. 11002, Infrared Technology and Applications XLV
KEYWORDS: Infrared detectors, Sensors, Calibration, Error analysis, Nitrogen, Bridges, Thermal imaging cameras, Cryocoolers, Thermal modeling, Cryogenics, Temperature metrology

Proceedings Article | 9 May 2018
Proc. SPIE. 10626, Tri-Technology Device Refrigeration (TTDR) III
KEYWORDS: Thermography, Infrared sensors, Sensors, Manufacturing, Reliability, Cryocoolers, Cryogenics, Prototyping

Proceedings Article | 9 May 2018
Proc. SPIE. 10626, Tri-Technology Device Refrigeration (TTDR) III
KEYWORDS: Databases, Coating, Manufacturing, Reliability, Acoustics, Failure analysis, Cryocoolers, Cryogenics

Proceedings Article | 5 May 2017
Proc. SPIE. 10180, Tri-Technology Device Refrigeration (TTDR) II
KEYWORDS: Infrared detectors, Defense and security, Thermography, Sensors, Manufacturing, Reliability, Cryocoolers, Cryogenics, Prototyping, Temperature metrology

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