Dr. Christopher J. Chunnilall
at National Physical Lab
SPIE Involvement:
Publications (19)

Proceedings Article | 19 July 2023 Presentation
Rachel Clark, Petros Androvitsaneas, Luke Arabskyj, Philip Dolan, Ted Santana, Christopher Chunnilall, Alastair Sinclair, Ian Farrer, Anthony Bennett
Proceedings Volume PC12633, PC126330K (2023) https://doi.org/10.1117/12.2671755
KEYWORDS: Photons, Single mode fibers, Calibration, Single photon detectors, Quantum measurement, Quantum dots, Nanotechnology, Fluorescence, Superconductors, Silicon

Proceedings Article | 21 May 2018 Paper
M. Gramegna, I. Ruo Berchera, S. Kueck, G. Porrovecchio, C. Chunnilall, I. Degiovanni, M. Lopez, R. Kirkwood, T. Kübarsepp, A. Pokatilov, N. Castagna, J. Morel, F. Manoocheri , A. Vaigu
Proceedings Volume 10674, 106741K (2018) https://doi.org/10.1117/12.2307841
KEYWORDS: Quantum key distribution, Metrology, Telecommunications, Information security, Quantum communications, Quantum cryptography, Optical components, Single photon detectors, Standards development, Radiometry

Proceedings Article | 21 May 2018 Presentation + Paper
A. Vaquero-Stainer, R. Kirkwood, V. Burenkov, C. Chunnilall, A. Sinclair, A. Hart, H. Semenenko, P. Sibson, C. Erven, M. Thompson
Proceedings Volume 10674, 106741A (2018) https://doi.org/10.1117/12.2307409
KEYWORDS: Quantum key distribution, Transmitters, Receivers, Information security

SPIE Journal Paper | 13 August 2014 Open Access
OE, Vol. 53, Issue 08, 089801, (August 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.8.089801
KEYWORDS: Metrology, Sensors, Nanolithography, Roads, Optical engineering

SPIE Journal Paper | 10 July 2014 Open Access
OE, Vol. 53, Issue 08, 081910, (July 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.8.081910
KEYWORDS: Sensors, Single photon detectors, Metrology, Photodetectors, Quantum key distribution, Signal detection, Single photon, Calibration, Quantum efficiency, Surface plasmons

Showing 5 of 19 publications
Conference Committee Involvement (1)
Optical Diagnostic Methods for Inorganic Materials III
6 August 2003 | San Diego, California, United States
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