Mr. Christopher Eng
at Brookhaven National Lab
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 26, 2013
Proc. SPIE. 8851, X-Ray Nanoimaging: Instruments and Methods
KEYWORDS: Particles, Copper, Nickel, X-ray microscopy, Image resolution, Nondestructive evaluation, Tomography, Aluminum, X-ray imaging, Temperature metrology

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