Dr. Chris J. Evans
Senior Scientist at Univ of North Carolina at Charlotte
SPIE Involvement:
Senior status | Author
Publications (23)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Deflectometry, Segmented mirrors, Mirrors, Cameras, Optical alignment, Metrology, Telescopes, Interferometry, Fringe analysis, Moire patterns

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Additive manufacturing, Projection systems, Metrology, Metals, Laser manufacturing, Laser welding, Inspection, Interferometry, In situ metrology

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Wavefronts, Zernike polynomials, Modulation transfer functions, Freeform optics, Optical components, Optical design, Scattering

PROCEEDINGS ARTICLE | September 26, 2016
Proc. SPIE. 9961, Reflection, Scattering, and Diffraction from Surfaces V
KEYWORDS: Zernike polynomials, Fabrication, Freeform optics, Received signal strength, Raster graphics, Optical spheres, Germanium, Polishing, Spatial frequencies, Superposition

PROCEEDINGS ARTICLE | August 18, 2014
Proc. SPIE. 9203, Interferometry XVII: Techniques and Analysis
KEYWORDS: Reconstruction algorithms, Spatial frequencies, Surface finishing, Metrology, Freeform optics, Wavefronts, Error analysis, Polishing, Image quality, Adaptive optics

PROCEEDINGS ARTICLE | September 13, 2012
Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis
KEYWORDS: Spatial frequencies, Anisotropy, Surface finishing, Metrology, Visualization, Image processing, Mechanical engineering, Astronomy, Surface roughness, Optics manufacturing

Showing 5 of 23 publications
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