Dr. Chris J. Evans
Senior Scientist at Univ of North Carolina at Charlotte
SPIE Involvement:
Senior status | Author
Publications (23)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Telescopes, Mirrors, Segmented mirrors, Moire patterns, Fringe analysis, Metrology, Cameras, Interferometry, Deflectometry, Optical alignment

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Metrology, Metals, In situ metrology, Inspection, Laser welding, Interferometry, Additive manufacturing, Projection systems, Laser manufacturing

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Optical components, Optical design, Scattering, Wavefronts, Zernike polynomials, Modulation transfer functions, Freeform optics

PROCEEDINGS ARTICLE | September 26, 2016
Proc. SPIE. 9961, Reflection, Scattering, and Diffraction from Surfaces V
KEYWORDS: Fabrication, Superposition, Polishing, Optical spheres, Spatial frequencies, Germanium, Zernike polynomials, Raster graphics, Freeform optics, Received signal strength

PROCEEDINGS ARTICLE | August 18, 2014
Proc. SPIE. 9203, Interferometry XVII: Techniques and Analysis
KEYWORDS: Polishing, Metrology, Spatial frequencies, Error analysis, Wavefronts, Adaptive optics, Image quality, Reconstruction algorithms, Freeform optics, Surface finishing

PROCEEDINGS ARTICLE | September 13, 2012
Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis
KEYWORDS: Astronomy, Metrology, Visualization, Spatial frequencies, Image processing, Surface roughness, Mechanical engineering, Optics manufacturing, Surface finishing, Anisotropy

Showing 5 of 23 publications
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