Dr. Christopher J. Evans
Senior Scientist at Univ of North Carolina at Charlotte
SPIE Involvement:
Author
Publications (25)

Proceedings Article | 20 August 2020 Presentation + Paper
Proc. SPIE. 11487, Optical Manufacturing and Testing XIII
KEYWORDS: Mathematical modeling, Metrology, LabVIEW, Sensors, Data acquisition, Time metrology, Freeform optics, Motion measurement, Body temperature, Temperature metrology

Proceedings Article | 14 May 2019 Presentation + Paper
Proc. SPIE. 10998, Advanced Optics for Imaging Applications: UV through LWIR IV
KEYWORDS: Mathematical modeling, Nanotechnology, Telescopes, Mirrors, Metrology, Error analysis, Manufacturing, Monte Carlo methods, Freeform optics, Optics manufacturing

Proceedings Article | 23 August 2017 Presentation + Paper
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Optical components, Optical design, Scattering, Wavefronts, Zernike polynomials, Modulation transfer functions, Freeform optics

Proceedings Article | 23 August 2017 Presentation + Paper
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Telescopes, Mirrors, Segmented mirrors, Moire patterns, Fringe analysis, Metrology, Cameras, Interferometry, Deflectometry, Optical alignment

Proceedings Article | 23 August 2017 Presentation + Paper
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Metrology, Metals, In situ metrology, Inspection, Laser welding, Interferometry, Additive manufacturing, Projection systems, Laser manufacturing

Showing 5 of 25 publications
Conference Committee Involvement (2)
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Munich, Germany
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
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