Error sources, compensation, and probe path optimization for on-machine metrology of freeform optics
Usefulness of orthogonal basis sets for predicting optical performance of wavefronts with mid-spatial frequency error
Application of instrument transfer function to a fringe projection system for measuring rough surfaces
Spurious mid-spatial frequency structure on optical surfaces reconstructed from surface slope measurements
Comparison of the area structure function to alternate approaches for optical surface characterization
High performance Fizeau and scanning white-light interferometers for mid-spatial frequency optical testing of free-form optics
Comment on the paper "Interferometric testing of optical surfaces: absolute measurements of flatness"