Dr. Christopher E. Fink
Chief Technical Officer at JRM Technologies Inc
SPIE Involvement:
Author
Area of Expertise:
thermal physics , reflection physics , atmospheric physics , signature simulation
Websites:
Publications (4)

Proceedings Article | 3 May 2016
Proc. SPIE. 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII
KEYWORDS: Staring arrays, Infrared sensors, Mid-IR, Electronics, Cameras, Sensors, Calibration, Image sensors, Projection systems, Modulation transfer functions

Proceedings Article | 25 May 2005
Proc. SPIE. 5811, Targets and Backgrounds XI: Characterization and Representation
KEYWORDS: Light sources, Data modeling, Databases, Reflectivity, 3D modeling, Bidirectional reflectance transmission function, Solids, Chemical elements, Thermal modeling, Atmospheric modeling

Proceedings Article | 5 August 2004
Proc. SPIE. 5431, Targets and Backgrounds X: Characterization and Representation
KEYWORDS: Reflection, Databases, Computer programming, 3D modeling, Geographic information systems, Bidirectional reflectance transmission function, Solids, Chemical elements, Atmospheric modeling, RGB color model

Proceedings Article | 6 August 2002
Proc. SPIE. 4718, Targets and Backgrounds VIII: Characterization and Representation
KEYWORDS: Detection and tracking algorithms, Data modeling, Sensors, Reflectivity, Computer simulations, 3D modeling, Bidirectional reflectance transmission function, Scene simulation, Thermal modeling, Atmospheric modeling

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top