Christopher H. Freund
at National Measurement Institute of Australia
SPIE Involvement:
Author
Publications (6)

SPIE Journal Paper | March 2, 2012
JM3 Vol. 11 Issue 1
KEYWORDS: Metrology, Sensors, Atomic force microscopy, Scanning probe microscopes, Quartz, Frequency modulation, Scanning probe microscopy, Fermium, Mirrors, Interferometers

PROCEEDINGS ARTICLE | June 1, 2011
Proc. SPIE. 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Actuators, Mirrors, Metrology, Interferometers, Sensors, Quartz, Atomic force microscopy, Scanning probe microscopy, Standards development, Scanning probe microscopes

PROCEEDINGS ARTICLE | June 3, 2010
Proc. SPIE. 7729, Scanning Microscopy 2010
KEYWORDS: Mirrors, Metrology, Oscillators, Interferometers, Interferometry, Heterodyning, Laser interferometry, Scanning probe microscopy, Standards development, Scanning probe microscopes

PROCEEDINGS ARTICLE | November 11, 1999
Proc. SPIE. 3782, Optical Manufacturing and Testing III
KEYWORDS: LIGO, Monochromatic aberrations, Antireflective coatings, Reflection, Interferometers, Optical coatings, Reflectivity, Wavefronts, Distortion, Nanoimprint lithography

PROCEEDINGS ARTICLE | September 7, 1999
Proc. SPIE. 3738, Advances in Optical Interference Coatings
KEYWORDS: LIGO, Fringe analysis, Silica, Reflection, Interfaces, Coating, Reflectivity, Critical dimension metrology, Surface finishing, Fizeau interferometers

SPIE Journal Paper | August 1, 1999
OE Vol. 38 Issue 08
KEYWORDS: Phase shifts, Nanoimprint lithography, Optical testing, Monochromatic aberrations, Wavefronts, Fizeau interferometers, Semiconductor lasers, Sensors, Beam splitters, Foam

Showing 5 of 6 publications
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