Christopher I. Moir
at Exact Group LLP
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 18, 2009
Proc. SPIE. 7356, Optical Sensors 2009
KEYWORDS: Diffraction, Doppler effect, Sensors, Image quality, Laser Doppler velocimetry, Sensing systems, Velocimetry, Velocity measurements, Prototyping, Laser systems engineering

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